NFC/RFID test systemThe T-base NFC/RFID Test System automates Proximity Card (PICC) testing as described in:
- ISO/IEC 10373-6 Identification cards – Test methods – Part 6: Proximity cards, including the additional requirements in amendment 1: Additional PICC classes.
- NFC Forum Test Cases For Analogue V1.0.01.
Testing of all PICC classes are supported.
All necessary system calibration and PCD adjustments are included in the package.
All instrument control and data/result handling for test cases, adjustments and calibrations are fully automated.
The T-base NFC/RFID test system is being used by a major danish company, and it is verified by 2 leading NFC/RFID test laboratories in Europe.
The T-base NFC/RFID Test System SW is built using the generic T-base framework which is a modern and mature framework.
The SW consists of a sequencer, operator UI, error handling and other functionalities that are necessary for a generic framework.
The SW architecture makes it easy to add new tests, support new instruments and support new logging formats and targets.
Read more about T-base here:
But due to the intelligent SW architecture of T-base are instruments from other vendors easily implemented; simply by writing new instrument drivers.
The test system is developed with focus on ease of use; untrained users can operate this system after only 5 minutes of training.
For further information please contact Michael Rothmeier by the mail or phone number written at the bottom of this page.